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PMID: 11510828 Published · ppublish English Journal Article Research Support, U.S. Gov't, Non-P.H.S. Research Support, U.S. Gov't, P.H.S.

Experimental factors controlling analyte ion generation in laser desorption/ionization mass spectrometry on porous silicon.

Analytical chemistry ·Vol. 73 ·No. 15 ·2001-08-01 ·Pages 3639-45

Kruse RA, Li X, Bohn PW, Sweedler JV

Abstract

Desorption/ionization on porous silicon (DIOS) is a relatively new laser desorption/ionization technique for the direct mass spectrometric analysis of a wide variety of samples without the requirement of a matrix. Porous silicon substrates were fabricated using the recently developed nonelectrochemical H2O2-metal-HF etching as a versatile platform for investigating the effects of morphology and physical properties of porous silicon on DIOS-MS performance. In addition, laser wavelength, mode of ion detection, pH, and solvent contributions to the desorption/ionization process were studied. Other porous substrates such as GaAs and GaN, with similar surface characteristics but differing in thermal and optical properties from porous silicon, allowed the roles of surface area, optical absorption, and thermal conductivities in the desorption/ionization process to be investigated. Among the porous semiconductors studied, only porous silicon has the combination of large surface area, optical absorption, and thermal conductivity required for efficient analyte ion generation under the conditions studied. In addition to these substrate-related factors, surface wetting, determined by the interaction of deposition solvent with the surface, and charge state of the peptide were found to be important in determining ion generation efficiency.

MeSH Terms
Hydrogen-Ion Concentration Ions/analysis,chemistry Luminescent Measurements Oligopeptides/analysis Semiconductors/statistics & numerical data Silicon Spectrometry, Mass, Matrix-Assisted Laser Desorption-Ionization/instrumentation
Chemicals
Ions Oligopeptides Silicon
Authors & Affiliations
4 authors, click to expand affiliations / ORCID
Kruse R A
Department of Chemistry, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 61801, USA.
Li X
Bohn P W
Sweedler J V
Article Info
Journal
Analytical chemistry
Abbr.
Anal Chem
ISSN
0003-2700
Published
2001-08-01
Pages
3639-45
Language
English
Region
United States
NLM ID
0370536
Subset
IM
Grants
PHS HHS · NIH 31609 · United States
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